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There is no universally correct input resolution or tile size for solar-panel defect segmentation. Choose the smallest raster and tile that preserve the defect or boundary you must detect, include enough surrounding context for classification, fit the model’s memory budget, and perform well on representative held-out images. Select among candidates with per-class recall, IoU or Dice, boundary quality, stitched-tile artifacts, and measured deployment speed—not by copying a number from another dataset.

First identify the image modality. Aerial and satellite work is described by ground sampling distance (GSD), while electroluminescence (EL) and thermal workflows usually start with a sensor raster in pixels and then crop or resize it. Those quantities are related but not interchangeable, so settings that work for a 0.1 m UAV image should not be transferred mechanically to a 640 × 590 EL frame.

Start by defining what “resolution” means in your project

Aerial and satellite imagery: resolution is ground sampling distance

For aerial or satellite photovoltaic (PV) footprint segmentation, record the ground sampling distance: the physical ground length represented by one pixel. A 0.1 m GSD image contains far more spatial detail than a 0.8 m image, even if both are resized to the same neural-network input dimensions. Ground sampling distance determines how many pixels are available across a panel edge, a narrow gap, or a rooftop obstruction before any preprocessing occurs.

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Jiang et al. (2021) built a 3,716-sample multi-resolution dataset with three application scales. Their documented settings are useful comparison points, not universal prescriptions:

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Dataset group Ground sampling distance Typical PV scene in the study Sample tile Reported IoU in the recommended setting
PV08 0.8 m Concentrated utility-scale PV 1024 × 1024 pixels 0.845
PV03 0.3 m Distributed ground PV 1024 × 1024 pixels 0.871
PV01 0.1 m Fine-grained rooftop PV captured by UAV 256 × 256 pixels 0.868

The IoU values are specific to Jiang et al.’s data, model and experiments. The table demonstrates scale dependence: the finest imagery used smaller pixel tiles because the same physical neighborhood occupies many more pixels at 0.1 m GSD. It does not establish that 1024 or 256 is best for another sensor, site or architecture.

EL and thermal imagery: resolution is usually a raster dimension

In EL or thermal inspection, the first specification is commonly the native image width and height. A crop of a module, a cell, or a region of interest can then be resized to the network input. Record the native raster, crop coordinates, resize factor and interpolation method; otherwise you cannot tell whether a missed defect was absent from the sensor image or erased during preprocessing.

The MSPS monocrystalline-silicon EL repository describes 1,500 images at 640 × 590 pixels. Its annotated defects have a mean area of 128 pixels², a range from 1 to 821 pixels², and an approximate defect-pixel share of 0.05%. Those figures show why an apparently generous image size can still produce a severe small-target problem: most pixels are background and some defects occupy only a handful of pixels.

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Other benchmarks use different acquisition scales. Pratt, Mattheus and Klein (2023) report 593 cell images with pixel masks. The MFPN-ASPP study (2026) uses 1,009 UAV thermal images, each 512 × 640 pixels. These dimensions describe those datasets; they are not a recommended input for every EL or thermal camera.

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Define the output before selecting pixels

Separate panel footprints from defects inside cells or modules

PV-footprint segmentation asks the model to outline complete panels in an aerial scene. Defect segmentation asks it to mark cracks, inactive areas, hotspots, delamination or other abnormal regions within a cell or module. A panel boundary may span hundreds of pixels while a defect of interest may be only a few pixels wide. The tile must satisfy the smallest output object that matters, not merely make the overall panel recognizable.

Write an explicit smallest-actionable-target specification

List the defect types that trigger a maintenance decision and estimate their native pixel width and area. Use several representative images, including difficult backgrounds and low-contrast examples. If a defect is one pixel wide in the native raster, a 0.5× resize reduces its width below one pixel and forces interpolation to blend it with neighboring classes. For an isotropic resize factor s, linear dimensions scale by s and area scales approximately by s²; this simple relationship is enough to predict which candidate inputs may erase small targets.

Do not impose a universal minimum such as “every defect must be 16 pixels.” The actionable threshold depends on annotation quality, sensor noise, contrast, the model, and the cost of misses. Instead, measure how recall changes when the smallest targets are retained at native scale, moderately downsampled, and heavily downsampled.

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Build a small candidate grid instead of guessing one optimum

Use the native-resolution pipeline as a baseline, then test a limited grid of alternatives. For each candidate, keep the field of view and label geometry explicit:

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  • Native baseline: retain the original raster or the least aggressive crop that fits the model.
  • Moderate downsample: reduce dimensions only enough to meet memory or throughput targets.
  • Crop-based input: keep native detail but process smaller windows with overlap.
  • Higher-detail crop: use when the smallest defect is lost in the baseline resize and the deployment device can sustain the cost.

For each candidate, record input width and height, physical or module area covered, resize interpolation, crop policy, overlap, padding and batch size. A 1024-square tile and a 256-square tile are not equivalent experiments if they cover different physical areas or if one is extracted after a different resampling step.

Keep enough context for classification

A defect’s appearance can depend on nearby cell boundaries, busbars, panel edges, thermal gradients or shadows. A tile that tightly hugs the annotation may preserve pixels but remove the context needed to distinguish a defect from a normal feature. Start with a crop that includes the target plus a margin, then reduce the margin only if memory or latency requires it. The required margin is architecture-dependent: a network with a limited receptive field may need more explicit context than one that aggregates features over the whole tile.

Respect the model’s memory budget

Activation memory generally rises with the number of input pixels, and segmentation models often retain high-resolution feature maps. Measure peak memory during training and inference at the intended batch size, not just the file size of the input. If a larger tile causes out-of-memory failures, lower the batch size, use gradient accumulation during training, or switch to overlapping crops; do not silently resize away the smallest defects.

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A practical selection procedure

  1. Name the modality and output. State whether the task is aerial panel footprints, EL defects, visible-light cell defects, or thermal anomalies. For aerial images, record GSD; for EL and thermal images, record native raster dimensions, crop coordinates and any prior resizing.
  2. Measure the smallest target that matters. Estimate its pixel width and area in native images, including the lower tail rather than only the average. The MSPS statistics—1 to 821 pixels² with a 128-pixels² mean—illustrate why average size alone is insufficient.
  3. Choose a constrained candidate grid. Include a native-detail baseline and a few downsampled or cropped variants. Use tile dimensions that contain the target and its context while fitting the model and deployment memory. Treat the 1024-square and 256-square choices in Jiang et al.’s dataset as documented examples, not defaults.
  4. Split without near-duplicate leakage. Whenever possible, split by source image, module, site or acquisition session. Adjacent tiles from one source frame can share background and defects; putting them in both training and test sets inflates scores and hides failures on new modules or sites.
  5. Train with the same preprocessing used at inference. Apply identical resizing, normalization, color or thermal scaling, crop extraction and padding rules. A model evaluated on pristine center crops may fail when deployment tiles contain borders, sensor vignetting or interpolation artifacts.
  6. Measure small-target and boundary quality. Report per-class recall and IoU or Dice, then inspect masks for the smallest defects. Include a boundary metric or a structured visual review of edge placement and thin structures. Aggregate accuracy can look strong while rare defect recall is poor.
  7. Evaluate tiled inference and stitching. Record tile overlap, padding mode, prediction blending and the rule for merging masks. Inspect seams and objects cut at tile boundaries, not only isolated tile outputs.
  8. Benchmark on the real device. Log batch size, peak memory, latency or throughput and hardware. The MSPS repository attributes its throughput figures to an NVIDIA RTX 3090 Ti; those numbers should not be presented as expected speed on another GPU, an edge computer or a CPU.
  9. Revalidate after a source change. A new camera, GSD, thermal range, module type, site or weather condition can shift the pixel statistics. Hold out target-domain samples and fine-tune or recalibrate when performance drops.

Evaluate configurations with metrics that expose the real failure

Comparison axis What to record Why it matters
Smallest-target visibility Pixel width and area after preprocessing; recall by defect-size bin Shows whether resizing has removed the objects that drive maintenance decisions.
Class performance Per-class recall, precision, IoU and/or Dice Prevents a dominant background class from masking missed rare defects.
Boundary quality Boundary F-score or a consistent edge-review protocol Distinguishes a coarse blob from a useful cell, crack or panel outline.
Context and continuity Errors near busbars, module edges, shadows and tile borders Reveals whether the crop is too tight or the receptive field is insufficient.
Stitching behavior Seam count, duplicate detections, gaps and mask continuity after merging A tile model can score well alone yet create visible artifacts in a full inspection map.
Operational cost Peak memory, latency, throughput, energy or queue time on named hardware Connects an accuracy gain to a deployment decision rather than an abstract benchmark.
Robustness Scores by site, module type, acquisition session and sensor Identifies configurations that work only on one background or camera.

Pratt, Mattheus and Klein’s 2023 benchmark reports stronger IoU on larger features than on smaller defects. Use that result as a warning to stratify evaluation by object size; a single mean IoU can conceal the exact failure mode the inspection system is meant to prevent.

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Tile overlap, padding and stitching decisions

Choose overlap from the largest context that must remain intact

Overlap allows a defect near one tile edge to appear near the center of another tile, where the model has full context. The required overlap is not a fixed percentage. Determine it by testing the largest object or contextual pattern that should not be cut, then verify that the additional tiles fit the throughput budget.

Make edge handling explicit

At image borders, choose a documented policy such as reflective, replicate or constant padding, or use a smaller final tile with a valid-mask region. Apply the same policy during validation. Constant padding can create an artificial dark or uniform band that resembles a defect; reflective padding can mirror a crack or hotspot. Compare edge-error rates for each policy rather than assuming one is harmless.

Blend logits or probabilities before thresholding

When overlapping predictions are available, average or otherwise blend the model outputs in the overlap before converting them to a binary mask. Weighting the center more heavily can reduce edge bias, but it must be validated on your imagery. Threshold after blending so that two slightly different edge predictions do not produce a seam.

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Account for domain shift instead of transferring settings blindly

Resolution changes alter the apparent size and texture of every target. Jiang et al. report: “Our experiments show that direct cross application between samples with different resolutions is not feasible and that fine-tuning of the pre-trained deep networks using target samples is necessary.” Their statement describes experiments on their datasets, not a universal law for every architecture, but it is a strong reason to test target-domain images before deployment.

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If training data are 0.3 m aerial imagery and deployment data are 0.1 m UAV imagery, or if EL images come from a different camera, first measure the target-size distribution and background statistics. Then fine-tune with representative target samples, update normalization if required, and repeat the held-out evaluation. A model can retain high panel-level IoU while losing recall on small rooftop panels or cell defects after a resolution shift.

Worked selection patterns by modality

EL defect segmentation

Begin with the 640 × 590 native raster when the smallest actionable defect is near the lower end of the MSPS distribution. Extract module or cell crops without reducing them until you have measured the defect’s post-resize area. Compare native-detail crops with one or two downsampled candidates, keeping the same physical field of view where possible. Review tiny defects separately from broad inactive regions, because the approximately 0.05% defect-pixel share makes a background-dominated score especially misleading. If the native crop exceeds memory, prefer overlapping crops and consistent stitching over a single aggressive resize.

UAV thermal segmentation

For 512 × 640 thermal frames such as those described by the MFPN-ASPP study, preserve the sensor’s thermal scaling and document whether you crop around modules or process the full frame. A tile that is large enough to include neighboring cells may improve discrimination of a hotspot, while a smaller crop may retain more pixels per defect. Test both effects using per-class recall and boundary review. Do not assume that an RGB-trained preprocessing pipeline or EL contrast normalization is appropriate for thermal data.

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Aerial panel-footprint segmentation

Record GSD before choosing a pixel tile. At coarser GSD, a large physical tile may be needed to contain enough panel context; at finer GSD, the same physical area can require many more pixels, making smaller pixel tiles practical. Jiang et al.’s PV08, PV03 and PV01 groups show this relationship and provide dataset-specific IoU values for comparison. If your site mixes utility-scale and rooftop imagery, stratify validation by GSD and scene type instead of averaging them into one number.

Common failure modes and fixes

Observed symptom Likely cause Corrective action
Large regions segment well but tiny defects disappear Downsampling reduced the defect below a useful pixel scale; background dominates the loss Retain a native-detail candidate, use smaller overlapping crops, and report recall by defect size.
Predictions are accurate in tile centers but wrong at borders Insufficient context, unsuitable padding or no overlap Increase overlap, test padding policies, and blend overlapping outputs before thresholding.
Validation IoU is unexpectedly high but field performance is poor Adjacent tiles from one source leaked across the split Split by source image, module, site or acquisition session and rebuild the benchmark.
A model trained at one GSD fails at another Target-size and texture distributions shifted Collect target-domain samples, fine-tune and remeasure per-class and boundary metrics.
Throughput meets a desktop benchmark but misses the production deadline Hardware, batch size or precision differs from the benchmark setup Benchmark on the deployment device and report the complete configuration.
Segmentation masks look like coarse blobs Tile or network output stride is too coarse for the boundary requirement Test a higher-detail input, a smaller crop or an architecture/output stride that preserves edge detail.
Results change after a harmless-looking preprocessing update Interpolation, normalization, thermal scaling or crop coordinates changed Version preprocessing and compare pixel dimensions, target sizes and metrics before and after the change.

Document the decision so it can be reproduced

For every candidate, save a short configuration record containing:

  • Modality, camera or source type, GSD or native raster dimensions.
  • Crop dimensions, resize factor, interpolation and normalization.
  • Tile width and height, overlap, padding and stitching rule.
  • Model architecture, output stride, batch size and numerical precision.
  • Train, validation and test grouping rules.
  • Per-class recall, IoU or Dice, boundary results and size-stratified scores.
  • Peak memory, latency or throughput, device model and software versions.
  • Failure examples, especially the smallest defects and tile-edge cases.

This record lets you distinguish a genuine resolution benefit from a change in crop composition, augmentation, split leakage or hardware. It also makes later recalibration possible when a new sensor or site changes the input distribution.

A concise decision rule

Select the smallest input and tile that keep the smallest actionable defect measurable after preprocessing, provide enough surrounding context to classify it, and satisfy the deployment memory and latency budget. Keep a native-resolution or high-detail baseline, compare only a few alternatives, evaluate on source-independent held-out data, inspect boundaries and stitched seams, and fine-tune on target imagery when GSD or sensor conditions change. The published 0.8 m, 0.3 m and 0.1 m aerial settings, the 1024- versus 256-pixel tile examples, and the EL and thermal raster sizes are evidence of how projects differ—not a single number to copy.

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